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Experimental Physics IV

  1. 新万博体育下载_万博体育app【投注官网】
  2. Faculties
  3. Faculty of Mathematics, Natural Sciences, and Materials Engineering
  4. Institute of Physics
  5. Chairs, professors and groups
  6. Experimental Physics IV
  7. Equipment
  8. Scanning Probe Microscope (AFM/MFM)

Scanning Probe Microscope (AFM/MFM)

For the characterization of the magnetic domain structures and the surface morphologies of nanoscale devices and structures, we use a custom-modified Bruker Dimension ICON3 scanning probe microscope allowing for various scanning probe measurements (i.e. AFM, MFM) at room temperature.

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Picture of AFM/MFM setup
Main components of AFM (MFM) setup
Magnetic force microscopy: concept of “lift mode” measurements.

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